A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

The nanofluidic confinement apparatus: studying confinement-dependent nanoparticle behavior and diffusion

• Stefan Fringes,
• Felix Holzner and
• Armin W. Knoll

Beilstein J. Nanotechnol. 2018, 9, 301–310, doi:10.3762/bjnano.9.30

• tunable confinement between two surfaces. The interferometric detection setup allows us not only to detect the nano-objects with high sensitivity, but also to determine the 3D particle position and the wall separation in situ with nanometer spatial and millisecond temporal precision. Furthermore, a

Understanding interferometry for micro-cantilever displacement detection

• Alexander von Schmidsfeld,
• Tobias Nörenberg,
• Matthias Temmen and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

• applied to the cleaved end, resulting in a strongly asymmetric optical cavity that allows us to tune the interferometer from Fabry–Pérot to Michelson characteristics [8]. The laser is decoupled from the interferometric detection system through a Faraday isolator feeding the light into port 1 of the 3 dB

• mounting system [16]. Overall, we find that the oscillatory cantilever properties are not heavily affected by the interferometric detection while operating the interferometer in the Fabry–Pérot mode with high . Discussion Interferometric detection is a straightforward and highly sensitive method for

• sensitivity in the attonewton range has been claimed for measurements with an ultra-soft cantilever in conjunction with interferometric detection [19]. Although, other variants have been introduced [20][21][22], the fiber-optic interferometer [23][24][25][26] is the most commonly used optical setup for

Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• ; amplitude modulation; atomic force microscopy; fluid borne excitation; interferometric detection; laser-beam detection; spurious resonances; Introduction Dynamic atomic force microscopy (AFM) was introduced in the late 1980s [1] as the natural evolution of the first atomic force microscopes [2]. Thanks to

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• explored; these include heterodyne optical beam and interferometric detection [32][33][34] and current-based translinear readout circuitry [35]. Of these approaches, the latter shows excellent potential for low-noise and high-bandwidth direct OBD readout. Surmounting these technological challenges has thus

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• by crossover temperatures in the kilo- or Mega-Kelvin range. (Detector noise was assumed temperature independent). The best FM-KFM performance is expected from standard cantilevers. It can be expected that these probes in combination with interferometric detection might benefit from cooling to